Auflistung nach Schlagwort "scanning probe microscopy"

Auflistung nach Schlagwort "scanning probe microscopy"

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  • Schmidt, Hennrik; Rode, Johannes C.; Smirnov, Dmitri; Haug, Rolf J. (London : Nature Publishing Group, 2014)
    The electronic properties of bilayer graphene strongly depend on relative orientation of the two atomic lattices. Whereas Bernal-stacked graphene is most commonly studied, a rotational mismatch between layers opens up a ...